Chaves, P. C.Taborda, A:de Oliveira, Daniel Pipa SoaresReis, M. A.2015-03-022015-03-022014-01Chaves, P. C.; Taborda, A.; Oliveira, D. P. S. de; Reis, M. A. - CdTe detector based PIXE mapping of geological samples. In: Nuclear Instruments and Methods in Physics Research B, Vol. 318, Part A, 1 January 2014, p. 37-410168-583Xhttp://hdl.handle.net/10400.9/2609A sample collected from a borehole drilled approximately 10 km ESE of Bragança, Trás-os-Montes, was analysed by standard and high energy PIXE at both CTN (previous ITN) PIXE setups. The sample is a fine-grained metapyroxenite grading to coarse-grained in the base with disseminated sulphides and fine veinlets of pyrrhotite and pyrite. Matrix composition was obtained at the standard PIXE setup using a 1.25 MeV H+ beam at three different spots. Medium and high Z elemental concentrations were then determined using the DT2fit and DT2simul codes (Reis et al., 2008, 2013 [1] and [2]), on the spectra obtained in the High Resolution and High Energy (HRHE)-PIXE setup (Chaves et al., 2013 [3]) by irradiation of the sample with a 3.8 MeV proton beam provided by the CTN 3 MV Tandetron accelerator. In this paper we present results, discuss detection limits of the method and the added value of the use of the CdTe detector in this context.engAmostras de rochasAnálise de amostrasRaios XPIXECdTe detector based PIXE mapping of geological samplesjournal articlehttp://dx.doi.org/10.1016/j.nimb.2013.05.098