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Assessment of dye distribution in sensitized solar cells by microprobe techniques

dc.contributor.authorBarreiros, M. Alexandra
dc.contributor.authorCorregidor, V.
dc.contributor.authorAlves, L. C.
dc.contributor.authorGuimarães, Fernanda
dc.contributor.authorMascarenhas, João
dc.contributor.authorTorres, Erica
dc.contributor.authorBrites, Maria João
dc.date.accessioned2015-01-12T17:20:30Z
dc.date.available2015-01-12T17:20:30Z
dc.date.issued2015
dc.description.abstractDye sensitized solar cells (DSCs) have received considerable attention once this technology offers economic and environmental advantages over conventional photovoltaic (PV) devices. The PV performance of a DSC relies on the characteristics of its photoanode, which typically consists of a nanocrystalline porous TiO2 film, enabled with a large adsorptive surface area. Dye molecules that capture photons from light during device operation are attached to the film nanoparticles. The effective loading of the dye in the TiO2 electrode is of paramount relevance for controlling and optimizing solar cell parameters. Relatively few methods are known today for quantitative evaluation of the total dye adsorbed on the film. In this context, microprobe techniques come out as suitable tools to evaluate the dye surface distribution and depth profile in sensitized films. Electron Probe Microanalysis (EPMA) and Ion Beam Analytical (IBA) techniques using a micro-ion beam were used to quantify and to study the distribution of the Ru organometallic dye in TiO2 films, making use of the different penetration depth and beam sizes of each technique. Different 1D nanostructured TiO2 films were prepared, morphologically characterized by SEM, sensitized and analyzed by the referred techniques. Dye load evaluation in different TiO2 films by three different techniques (PIXE, RBS and EPMA/WDS) provided similar results of Ru/Ti mass fraction ratio. Moreover, it was possible to assess dye surface distribution and its depth profile, by means of Ru signal, and to visualize the dye distribution in sample cross-section through X-ray mapping by EPMA/EDS. PIXE maps of Ru and Ti indicated an homogeneous surface distribution. The assessment of Ru depth profile by RBS showed that some films have homogeneous Ru depth distribution while others present different Ru concentration in the top layer (2 lm thickness). These results are consistent with the EPMA/EDS maps obtained.por
dc.identifier.citationBarreiros, M.A.; Corregidor, V.; Alves, L.; Guimarães, F.; Mascarenhas, J.; Torres, E.; Brites, M.J. - Assessment of dye distribution in sensitized solar cells by microprobe techniques. In: Nuclear Instruments and Methods in Physics Research Section B, 2015, Vol. 348, p. 255-259por
dc.identifier.issn0168-583X
dc.identifier.urihttp://hdl.handle.net/10400.9/2576
dc.language.isoengpor
dc.publisherElsevierpor
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.nimb.2014.11.041por
dc.subjectSolar cellspor
dc.subjectDyespor
dc.subjectNanostructured materialspor
dc.subjectMicroscopypor
dc.titleAssessment of dye distribution in sensitized solar cells by microprobe techniquespor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage259por
oaire.citation.startPage255por
oaire.citation.titleNuclear Instruments and Methods in Physics Research Section Bpor
person.familyNameBarreiros
person.familyNameGuimarães
person.familyNameMascarenhas
person.familyNameBrites
person.givenNameMaria Alexandra
person.givenNameFernanda
person.givenNameJoão
person.givenNameMaria João de Sousa
person.identifierL-4674-2014
person.identifier.ciencia-id271D-7B29-E46C
person.identifier.ciencia-idCF18-4E59-B6B9
person.identifier.ciencia-id6710-13F6-3011
person.identifier.orcid0000-0002-0132-4969
person.identifier.orcid0000-0001-6961-9256
person.identifier.orcid0000-0003-0440-8057
person.identifier.orcid0000-0002-1081-7191
person.identifier.ridL-3318-2014
person.identifier.scopus-author-id6603680496
rcaap.rightsopenAccesspor
rcaap.typearticlepor
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relation.isAuthorOfPublicationc2c84ba4-fe6b-4c34-8a68-ffc0ad4ab352
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relation.isAuthorOfPublicationafcf1d4c-fc7e-4486-b0f4-58f27acc6834
relation.isAuthorOfPublication.latestForDiscovery3b1e7d6a-3232-443e-a747-f442427dc57a

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