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In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS

2021-07Journal article Embargoed access
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dc.contributor.authorCorregidor, V.
dc.contributor.authorBarreiros, M. Alexandra
dc.contributor.authorSalomé, P.M.P.
dc.contributor.authorAlves, L. C.
dc.date.accessioned2022-01-11T15:48:30Z
dc.date.embargo2026-12
dc.date.issued2021-07
dc.description.abstractABSTRACT: When considering materials to be used as active layers in solar cells, an important required parameter is the proper knowledge of their elemental composition. It should be heavily controlled during growth in order to obtain the desired band gap and to decrease the recombination defects and then increase the solar cell electrical performance. Ion beam analytical (IBA) techniques and, in particular, particle-induced X-ray emission (PIXE) and elastic backscattering spectrometry (EBS) are quite suitable to determine the thickness and composition of such active layers. Furthermore, if these techniques are performed using a nuclear microprobe, lateral and in-depth inhomogeneities can be clearly observed from 2D maps. In many cases, composition variations can be detected from the classical 2D maps obtained from the PIXE spectra. In this work, it is shown how the in-depth variations can also be studied when considering 2D maps reconstructed from the EBS spectra. Such variations are derived from processing conditions and can be related to (i) composition, (ii) thickness, (iii) roughness, and (iv) other nontrivial issues. Examples obtained on Cu(In,Ga)Se-2-based cells are presented and discussed. Furthermore, the combination of IBA techniques such as PIXE and EBS is shown to be a competitive and alternative method to the more used and established techniques such as X-ray fluorescence for checking the average composition of the solar cell active layers or secondary ion mass spectroscopy for determination of the elemental depth profile.pt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.citationCorregidor, Victoria... [et.al.] - In-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBS. In: Journal of Physical Chemistry C, 2021, Vol. 125, pp.16155-16165pt_PT
dc.identifier.doi10.1021/acs.jpcc.1c02731pt_PT
dc.identifier.eissn1932-7455
dc.identifier.issn1932-7447
dc.identifier.urihttp://hdl.handle.net/10400.9/3684
dc.language.isoengpt_PT
dc.peerreviewedyespt_PT
dc.publisherAmerican Chemical Societypt_PT
dc.relationIF/00133/2015pt_PT
dc.relationCenter for Nuclear Sciences and Technologies
dc.relationCentre for Nuclear Sciences and Technologies
dc.relation.publisherversionhttps://doi.org/10.1021/acs.jpcc.1c02731pt_PT
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/pt_PT
dc.subjectMaterialspt_PT
dc.subjectSolar cellspt_PT
dc.subjectX-ray diffractionpt_PT
dc.subjectNanoparticlespt_PT
dc.titleIn-Depth Inhomogeneities in CIGS Solar Cells: Identifying Regions for Performance Limitations by PIXE and EBSpt_PT
dc.typejournal article
dspace.entity.typePublication
oaire.awardTitleCenter for Nuclear Sciences and Technologies
oaire.awardTitleCentre for Nuclear Sciences and Technologies
oaire.awardURIinfo:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F04349%2F2020/PT
oaire.awardURIinfo:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UID%2FMulti%2F04349%2F2019/PT
oaire.citation.endPage16165pt_PT
oaire.citation.startPage16155pt_PT
oaire.citation.titleJournal of Physical Chemistry Cpt_PT
oaire.citation.volume125pt_PT
oaire.fundingStream6817 - DCRRNI ID
oaire.fundingStream6817 - DCRRNI ID
person.familyNameBarreiros
person.givenNameMaria Alexandra
person.identifierL-4674-2014
person.identifier.ciencia-id271D-7B29-E46C
person.identifier.orcid0000-0002-0132-4969
person.identifier.scopus-author-id6603680496
project.funder.identifierhttp://doi.org/10.13039/501100001871
project.funder.identifierhttp://doi.org/10.13039/501100001871
project.funder.nameFundação para a Ciência e a Tecnologia
project.funder.nameFundação para a Ciência e a Tecnologia
rcaap.rightsembargoedAccesspt_PT
rcaap.typearticlept_PT
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