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Characterization and electrochemical behaviour of nanostructured calcium samarium manganite electrodes fabricated by RF-Magnetron Sputtering

dc.contributor.authorBarrocas, B.
dc.contributor.authorSério, S.
dc.contributor.authorRovisco, A.
dc.contributor.authorNunes, Y.
dc.contributor.authorde Sá, A.I.
dc.contributor.authorPereira, M. I. da Silva
dc.contributor.authorJorge, M. E. Melo
dc.date.accessioned2014-10-27T16:00:06Z
dc.date.available2014-10-27T16:00:06Z
dc.date.issued2014
dc.description.abstractCa1-xSmxMnO3(0 . x . 0.4) films were successfully fabricated on Indium Tin Oxide (ITO) coated quartzglass substrates by radio frequency magnetron sputtering technique (RF- magnetron sputtering) fromcompacted nanosized powder targets, and subsequent annealing at 800.C in air, for 6 h. X-ray diffrac-tion shows a pure typical perovskite phase for x . 0.1. Scanning electron microscopy and atomic forcemicroscopy revealed that the films surface is dense, with low roughness, depending on the Sm content, even though a few cracks were observed. Crystallite size was found to decrease with the Sm content. Theelectrodes were characterized by cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS). The oxide electrode fs capacitance was estimated using both techniques and the corresponding roughness factors evaluated. The values obtained from the two methods show a good agreement. A com-parison between the voltammetric data and those referred in the literature allowed finding out that theredox reaction occurring at the electrode surface involves the pair Mn4+/Mn3+. EIS measurements con-firm the voltammetric data and they also give additional information about the film porosity and the charge transfer resistance. This last parameter is associated with the oxidation and reduction of the pairMn3+/Mn4+and after normalized by the roughness factor shows an increase with samarium content.por
dc.identifier.citationBarrocas, B.; Sério, S.; Rovisco, A.; Nunes, Y.; Sá, A.I. de; Pereira, M.I. da Silva; Jorge, M.E. Melo. Characterization and electrochemical behaviour of nanostructured calcium samarium manganite electrodes fabricated by RF-Magnetron Sputtering. In: Electrochimica Acta, 2014, Vol. 137, p. 99-107por
dc.identifier.issn0013-4686
dc.identifier.urihttp://hdl.handle.net/10400.9/2546
dc.language.isoengpor
dc.publisherElsevierpor
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.electacta.2014.05.123por
dc.subjectManganites electrodespor
dc.subjectCyclic voltammetrypor
dc.subjectMagnetron sputteringpor
dc.subjectElectrochemical impedance spectroscopypor
dc.subjectElectrode roughnesspor
dc.titleCharacterization and electrochemical behaviour of nanostructured calcium samarium manganite electrodes fabricated by RF-Magnetron Sputteringpor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage107por
oaire.citation.startPage99por
oaire.citation.titleElectrochimica Actapor
oaire.citation.volume137por
person.familyName
person.givenNameAna
person.identifier.ciencia-idB615-CCF2-424E
person.identifier.orcid0000-0003-1267-7994
rcaap.rightsopenAccesspor
rcaap.typearticlepor
relation.isAuthorOfPublication5d35b81a-2f1b-4051-b8bc-d1a4b0934a01
relation.isAuthorOfPublication.latestForDiscovery5d35b81a-2f1b-4051-b8bc-d1a4b0934a01

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